WebbKey Features. High Power Wafer Probing Equipment. Test and characterize power devices up to 10 KV or 500 Amps. Manual, Semiautomatic and Fully Automatic Configurations. … WebbFull test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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WebbThe MPI Advanced Semiconductor Test Division is providing a wide range of engineering probe systems addressing the specific requirements of various market segments and applications such as Device … Webb9 aug. 2014 · Probe Card Characteristics: • VLCT Single Site 8” Probe card • Needle Diameter : 25 um (1mil) • BCF : 2.8+/-1g (80 um O/D) • X Y position: +/-10 um Planarity : Test Method • A single site probe card was fabricated using MJC VP 50 technology with Type 1 or hand-wired interconnect technology for a MCT 62 Test Chip Device. Webbwafer test temperature ranges from 15°C to 200°C. 1.5 μm positional accuracy; support for vertical and membrane-style probe cards; bumped-die probing with at-speed testing. … those weren\u0027t scooby snacks